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Publicationer information ikon
New developments
in
the
simulation
of
Rutherford
backscattering
spectrometry
in
channel
in
g
mode
us
in
g arbitrary atom structures
Referentgranskad
Öppen tillgång
DOI
10.1088/1361-651X/ab81a9
J
in
, X
in
; Crocombette, Jean-Paul; Djurabekova, Flyura; Zhang, Shuo; Nordlund, Kai; Garrido, Frederic...
Modell
in
g and
Simulation
in
Materials Science and Eng
in
eer
in
g
2020
Publicationer information ikon
Simulation
of
Rutherford
backscattering
spectrometry
from arbitrary atom structures
Referentgranskad
Öppen tillgång
DOI
10.1103/PhysRevE.94.043319
Zhang, S.; Nordlund, K.; Djurabekova, F.; Zhang, Y.; Velisa, G.; Wang, T. S.
Physical Review E
2016
Publicationer information ikon
Effect of lattice voids on
Rutherford
backscattering
dechannel
in
g
in
tungsten
Referentgranskad
Öppen tillgång
DOI
10.1088/1361-6463/acad12
J
in
, X
in
; Djurabekova, Flyura; Sequeira, Miguel; Lorenz, Kathar
in
a; Nordlund, Kai
Journal of Physics D: Applied Physics
2023
Publicationer information ikon
In
fluence of surface topography on depth profiles obta
in
ed by
Rutherford
backscattering
spectrometry
Referentgranskad
DOI
10.1063/1.371835
Slotte, J.; Laakso, A.; Ahlgren, Tommy; Rauhala, Eero; Salonen, R.; Räisänen, J.; Simon, A.; Uzonyi,...
Journal of Applied Physics
2000
Publicationer information ikon
Mixed-
Mode
Simulation
in
APLAC
Referentgranskad
Marjoniemi, S.; Kallio, A.; Kujanpää, T.
Hels
in
ki University of Technology
2001
Publicationer information ikon
Characterization of doped strontium sulfide th
in
films by secondary ion mass
spectrometry
,
Rutherford
backscattering
spectrometry
and x-ray fluorescence
spectrometry
Referentgranskad
Lehto, S.; So
in
in
en, P.; Ni
in
isto, L.; Likonen, J.; Lappala
in
en, R.
Analyst
1994
Publicationer information ikon
Unveil
in
g the radiation-
in
duced defect production and damage evolution
in
tungsten us
in
g multi-energy
Rutherford
backscattering
spectroscopy
in
channel
in
g configuration
Referentgranskad
Öppen tillgång
DOI
10.1016/j.actamat.2023.119499
Markelj, S.; J
in
, X.; Djurabekova, F.; Zavašnik, J.; Punzón-Quijorna, E.; Sel
in
ger, T. Schwarz; Cres...
Acta Materialia
2024
Publicationer information ikon
Characterization of doped strontium sulfide th
in
films by Secondary Ion Mass
Spectrometry
,
Rutherford
Backscattering
spetrometry and X-ray Fluorescence
Spectrometry
Referentgranskad
DOI
10.1039/AN9941901725
Lehto, Sari; So
in
in
en, Pekka; Ni
in
isto, Lauri; Likonen, Jari; Lappala
in
en, Reijo
Analyst
1994
Publicationer information ikon
Ion
backscattering
measurements and analysis of electronic materials.
Referentgranskad
Saarilahti, J.
Acta Polytechnica Scand
in
avica
1995
Publicationer information ikon
Book Review: Radar target
backscattering
simulation
Eskel
in
en, Pekka
IEEE Aerospace and Electronic Systems Magaz
in
e
2002
New developments
in
the
simulation
of
Rutherford
backscattering
spectrometry
in
channel
in
g
mode
us
in
g arbitrary atom structures
Referentgranskad
Öppen tillgång
DOI
10.1088/1361-651X/ab81a9
2020
Simulation
of
Rutherford
backscattering
spectrometry
from arbitrary atom structures
Referentgranskad
Öppen tillgång
DOI
10.1103/PhysRevE.94.043319
2016
Effect of lattice voids on
Rutherford
backscattering
dechannel
in
g
in
tungsten
Referentgranskad
Öppen tillgång
DOI
10.1088/1361-6463/acad12
2023
In
fluence of surface topography on depth profiles obta
in
ed by
Rutherford
backscattering
spectrometry
Referentgranskad
DOI
10.1063/1.371835
2000
Mixed-
Mode
Simulation
in
APLAC
Referentgranskad
2001
Characterization of doped strontium sulfide th
in
films by secondary ion mass
spectrometry
,
Rutherford
backscattering
spectrometry
and x-ray fluorescence
spectrometry
Referentgranskad
1994
Unveil
in
g the radiation-
in
duced defect production and damage evolution
in
tungsten us
in
g multi-energy
Rutherford
backscattering
spectroscopy
in
channel
in
g configuration
Referentgranskad
Öppen tillgång
DOI
10.1016/j.actamat.2023.119499
2024
Characterization of doped strontium sulfide th
in
films by Secondary Ion Mass
Spectrometry
,
Rutherford
Backscattering
spetrometry and X-ray Fluorescence
Spectrometry
Referentgranskad
DOI
10.1039/AN9941901725
1994
Ion
backscattering
measurements and analysis of electronic materials.
Referentgranskad
1995
Book Review: Radar target
backscattering
simulation
2002
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